Shimadzu X-Ray Diffractometer (XRD-7000) for residual stress determination

Main description

Framatome’s ShimadzuTM X-Ray Diff ractometer (XRD-7000) provides non-destructive material analysis by measuring the strain in the crystal lattice. This exclusive XRD technique can also measure the residual stress on shot-peened austenitic stainless steel surfaces. Chemistry experts can observe X-ray diffractions of metal fractures to discover extra insights regarding influencing mechanisms and mechanical conditions.

Product Sheet